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Thermal verification testing of commercial printed-circuit boards for spaceflight

机译:商业航天印刷电路板的热验证测试

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摘要

A method is discussed developed to verify commercial printed-circuit boards for a shuttle orbital flight. The Space Acceleration Measurement System Project used this method first with great success. The test sequence is based on early fault detection, desire to test the final assembly, and integration with other verification testing. A component thermal screening test is performed first to force flaws in design, workmanship, parts, processes, and materials into observable failures. Then temperature definition tests are performed that consist of infrared scanning, thermal vacuum testing, and preliminary thermal operational testing. Only the engineering unit is used for temperature definition testing, but the preliminary thermal operational testing is performed on the flight unit after the temperature range has been defined. In the sequence of testing, vibration testing is performed next, but most vibration failures cannot be detected without subsequent temperature cycling. Finally, final assembly testing is performed to simulate the shuttle flight. An abbreviated thermal screening test is performed as a check after the vibration test, and then a complete thermal operational test is performed. The final assembly test finishes up with a burn-in of 100 hours of trouble-free operation. Verification is successful when all components and final assemblies have passed each test satisfactory. This method was very successful in verifying that commercial printed-circuit boards will survive in the shuttle environment.
机译:讨论了开发一种方法来验证用于航天飞机轨道飞行的商业印刷电路板。太空加速度测量系统项目首先成功地使用了这种方法。测试顺序基于早期故障检测,测试最终组件的愿望以及与其他验证测试的集成。首先执行组件热筛选测试,以将设计,工艺,零件,过程和材料中的缺陷强制为可观察到的故障。然后执行温度定义测试,包括红外扫描,热真空测试和初步热运行测试。仅工程单位用于温度定义测试,但是在定义温度范围后,对飞行单元执行初步的热运行测试。按照测试顺序,接下来将执行振动测试,但是如果没有随后的温度循环,则无法检测到大多数振动故障。最后,执行最终组装测试以模拟航天飞机的飞行。作为振动测试后的检查,执行简短的热屏蔽测试,然后执行完整的热操作测试。最终组装测试以100小时无故障运行的预烧结束。当所有组件和最终组件均通过每个测试均令人满意时,验证成功。该方法非常成功地验证了商用印刷电路板能否在航天飞机环境中生存。

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    Foster, William M., II;

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  • 年度 1991
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